Parameter optimization of sapphire wafer lapping with fixed abrasive pad
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摘要: 为了满足蓝宝石晶片高效低损伤的加工要求,采用亲水性固结磨料研磨垫研磨蓝宝石晶片的工艺,研究基体中碳化硅粒度尺寸、基体类型、金刚石粒度尺寸及研磨液中磨料4个因素对材料去除率和表面粗糙度的影响,并综合优化获得高加工效率和优表面质量的工艺参数。实验结果表明:基体中碳化硅粒度尺寸为10 μm、基体类型为Ⅱ、研磨垫采用F公司粒度尺寸为35~45 μm的金刚石、研磨液中磨料的粒度尺寸为5 μm的碳化硅为最优工艺组合,亲水性固结磨料研磨蓝宝石的材料去除率为431.2 nm/min,表面粗糙度值为Ra 0.140 2 μm。Abstract: In order to meet the requirements of the high processing efficiency and low damage of sapphire wafer,hydrophilic fixed abrasive lapping technology was adopted.The effects of silicon carbide particle size in matrix,matrix types,diamond particle size and abrasive in the slurry on material removal rate and surface roughness were investigated.The optimized process parameters for high material removal rate and good surface quality were obtained,which were 5 μm of SiC abrasive in the slurry,35-45 μm of diamond particle by company F,Ⅱof matrix type,10 μm of SiC particle size in matrix.The material removal rate could reach 413.2nm/min and average surface roughness Ra 0.140 2 μm.
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Key words:
- hydrophilic fixed abrasive pad /
- sapphire wafer /
- lapping /
- material removal rate /
- surface roughness
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