Preparation and propertiesof intermetallic-bonded diamond grindingwheel for thinning silicon carbide wafers
-
摘要: 与硅基材料相比,碳化硅因其导热性好、击穿电场强度高和禁带宽度大等特性成为了芯片制造的理想基底材料。但碳化硅晶片莫氏硬度高达9.5,磨削困难。实现碳化硅单晶片的磨削减薄加工,降低磨削成本,提高碳化硅晶片的加工质量,成为了半导体行业亟待解决的问题。本文探究采用Cu3Sn和Cu6Sn5金属间化合物作为粘结剂,制备了面向碳化硅晶片粗磨和精磨的金刚石砂轮。实验研究结果表明:此种超硬材料砂轮能够适用于SiC单晶片的磨削加工,所制备的2000#金刚石粗磨砂轮磨削6英寸碳化硅晶片的磨耗比达1:5,碳化硅晶片表面光洁度为11 nm;12000#金刚石精磨砂轮磨耗比1:0.6,表面光洁度达2.076 nm,TTV小于3 µm,磨削效果良好,可满足工业生产需要。Abstract: Compared with silicon based materials, silicon carbide has become an ideal substrate material for chip manufacturing due to its good thermal conductivity, breakdown electric field strength, and high bandgap width. However, the Mohs hardness of silicon carbide wafers is as high as 9.5. Realizing the grinding process of silicon carbide single crystal wafers, reducing grinding costs, and improving the processing quality of silicon carbide wafers has become an urgent problem to be solved in the semiconductor industry. This article uses Cu3Sn and Cu6Sn5 intermetallic compounds as bond to prepare rough and fine grinding diamond wheels for silicon carbide wafers. The experimental research results show that this diamond grinding wheel is suitable for grinding SiC single crystal wafers, the wear ratio of the prepared 2000# diamond rough grinding wheel for grinding 6-inch silicon carbide wafers is 1: 5, the surface roughness of the silicon carbide wafer is 11nm; The wear ratio of the 12000# diamond fine grinding wheel is 1: 0.6, the surface roughness is 2.076 nm, and the TTV is less than 3 µm. The grinding performance is good and can meet the needs of industrial production.
-
Key words:
- intermetallic compound /
- diamond /
- silicon carbide wafer /
- grinding performance
点击查看大图
计量
- 文章访问数: 496
- HTML全文浏览量: 146
- 被引次数: 0